Specification	Details
Model	X-Rite i1Basic Pro 3 Plus
Experience Level	Intermediate to Advanced
Aperture	Measurement aperture: 8 mm (0.31") diameter. Effective measurement aperture during scanning depends on patch size and measurement speed.
Measurement Geometry	45°/0° ring illumination optics, ISO 13655:2017
Measurement Conditions	M0, UV included, ISO 13655:2017 M1, D50, ISO 13655:2017 M2, UV excluded filter, ISO 13655:2017 M3, Polarization, UV excluded, ISO 13655:2017
Light Source	i1Pro 3 Plus LED illumination, including UV
Spectral Analyzer	i1® technology with built-in wavelength check, holographic diffraction grating with 128-pixel diode array
Spectral Range	380 nm to 730 nm
Spectral Reporting	380 to 730 nm in 10 nm steps
Photometric Range	Optical resolution: 10 nm. Physical sampling interval: 3.5 nm.
Measurement Frequency in Scanning Mode	400 measurements per second
Scanning Capability	Yes
Single Pass Scan	Yes
Scan Length	Maximum 515 mm (20.28")
Patch Size	Spot mode: 14 x 14 mm (0.55" x 0.55"). Scanning mode: 16 x 16 mm with i1iO or sensor ruler. 20 x 16 mm without sensor ruler. 20 x 16 mm with sensor ruler in M3 mode. 22 x 16 mm without sensor ruler in M3 mode.
Illumination Spot Size	12 mm (0.47")
Inter-Instrument Agreement	0.3 ΔE00 average, 0.8 ΔE00 maximum. Deviation from X-Rite manufacturing standard at 23°C (73.4°F) on 12 BCRA tiles (D50, 2°).
Short Term Repeatability - White	0.05 ΔE00 on white (D50, 2°), mean of 10 measurements every 3 seconds.
Emission Measurement	Measurement range: 0.2 to 5000 cd/m². Short-term repeatability: x,y ±0.002 typical (5000 K, 80 cd/m²).
Ambient Light Measurement	Spectral irradiance [mW/nm/m²], illuminance [lux], cosine corrected diffuser light measurement head.